IEEE Reliability Society Newsletter Vol. 57, No. 1. February 2011

Table of Content

Front page:
President's Message

From the Editor

Messages from VPs:

VP Publications Report from Dr. Robert Loomis

Society News:

2011 EXCOM and ADCOM Members

Prestigious Engineer of the Year Award

Best Chapter Awards

AdCom Meeting

Nominations for IEEE Medals and Recognitions

RS seeks Administrative Committee Candidates for 2012/2013/2014 Term

Reliability Society Past AdCom Members Obituaries:
Former RS President Monshaw Dies At 84

Obituary for Ann Miller


Feature Articles:
Reliability through the Ages

Reliability Overview of Air Traffic Reliability in the National Air Space

 

 

Regular Articles:

Field Based Reliability Calculations (MTBF) – Surmounting Practical Challenges. An outside the box approach.

Applying basic and familiar reliability theory to estimating and improving the avialablity of software-intensive systems

Fault Tolerance in Web Services


PHM Articles:

Detection of Multiple Failure-Modes in Electronics using Self-Organized Mapping

 


Book Review :

Reliability Engineering Book Review


Chapter Activities:
Cleveland Chapter

Taipei/Tainan Chapter

The Denver Chapter awarded a certificate to Hobbs Engineering

Announcements:
Solicitation for Society Technical Committees

UK&RI Workshop on Reliability and Safety

WCEAM-IMS 2001



Links:
Reliability Society Home


RS Newsletter Homepage

Solicitation for Society Technical Committees


The Reliability Society is soliciting the formation of new technical committees within the society fields of interest. The Society is concerned with attaining, assessing, and assuring system reliability, in the broadest sense, and maintaining it throughout its life cycle. Its areas of interest encompass service and process at all product levels, technologies and technical groups who are designing, analyzing, producing and assessing some portion or level of a system, be it hardware, software, devices, processes, or materials. Therefore, areas for possible technical committees are very broad including the associated technical areas of Availability, Maintainability, Testability, Diagnostics, Prognostics and Health Management, Integrity, Security, Quality, Supportability, Human Engineering, and System Safety. A list of prior technical committees can be found on the society website (http://www.ieee.org/reliabilitysociety) through the left side menu > Chapters, Committees & Officers > Technical Operations.

Technical committees are intended to:
  1. Monitor the technical state-of-the-art in their field, detect the need for new technical developments, and take action to stimulate interest in such development,
  2. Foster closer relationships between this Society and other Societies, Groups and organizations with common interests,
  3. Generate or coordinate technical material to spread sphere of knowledge and influence in their field of interest, such as:
    • Arrange, through appropriate editors, for publishing pertinent papers in IEEE publications (i.e. Transactions, newsletter, ATR, etc.),
    • Organize and operate sessions at meetings of IEEE at all levels and at meetings of other organizations, and
    • Generate and develop appropriate standards in its field for processing by or through the IEEE Standards Committee.
Society officers can assist the technical committee in any of these activities. The Society webpage will also advertise each committee and provide an address for other potential members in this field to contact the committee. In the near future, we will be expanding the website Technical Activities area to allow each committee to post information and products they wish to communicate to others.

The Society's technical committees form a cornerstone of our technical activity and influence. Many of the prior committees are no longer active and are in need of regeneration. Anyone currently involved in, or interested in creating, a group of like interested individuals in a particular field, is requested to contact Lon Chase, VP Tech Activities (l.chase@ieee.org) for more information on how to become involved.




Announcing the new LED Reliability Technical Committee


The LED Reliability committee will serve as a platform to monitor and foster the development in the field of LED components and SSL system reliability. The technical committee ‘s field of interest include
  • Monitoring and Identifying new developments in LED reliability including SSL systems.
  • Taking actions to stimulate interests and developments in LED reliability and SSL systems.
  • Taking part in development of reliability testing methods and life prediction modeling for LEDs and SSL systems.
  • Generate or coordinate technical materials to share and influence the fields.
  • Arrange for publishing pertinent papers in IEEE publications.
  • Organize and operate sessions at meetings of IEEE at all levels and at meetings of other organizations.
For more information and to become involved in this committee, please contact Steve Yang (liyu@ieee.org).